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Chin. Opt. Lett.
 Home  List of Issues    Issue 07 , Vol. 01 , 2003    Readout of super-resolution marks with Ti thin film


Readout of super-resolution marks with Ti thin film
Jingsong Wei1, Yang Wang1, Wendong Xu1, Zhenrong Sun2, Feng Zhang1, Fei Zhou1, Fuxi Gan1
1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 2018002East China Normal University, Shanghai 200062

Chin. Opt. Lett., 2003, 01(07): pp.420-420-

DOI:
Topic:Optical data storage
Keywords(OCIS Code): 210.4590  210.4680  160.4330  190.4720  

Abstract
Using Ti as the super-resolution reflective film to replace the Al reflective layer in conventional read-only optical disk, the recording marks with a diameter of 380 nm and a depth of 50 nm are read out in a dynamic testing device whose laser wavelength is 632.8 nm and numerical aperture of the lens is 0.40. The optimum Ti thin film thickness is 18 nm and the corresponding signal-noise-ratio is 32 dB.

Copyright: © 2003-2012 . This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

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Received:2003/3/17
Accepted:
Posted online:

Get Citation: Jingsong Wei, Yang Wang, Wendong Xu, Zhenrong Sun, Feng Zhang, Fei Zhou, Fuxi Gan, "Readout of super-resolution marks with Ti thin film," Chin. Opt. Lett. 01(07), 420-420-(2003)

Note: This work is financially supported by the National Natural Science Foundation of China (No. 60207005), the National 863 Project of China (No. 2002AA313030), and the National Research Fund for Fundamental Key Project 973 (No. 19990330). The authors gratefully acknowledge Prof. H. Ruan and Dr. B. Liu for helpful discussion and experiments. J. Wei’s e-mail address is weijingsong@netease.com.



References

1. J. Tominaga and C. Mihelcea, Appl. Phys. Lett. 78, 2417 (2001).

2. J. Tominaga, T. Nakano, and N. Atoda, Proc. SPIE 4085, 36 (2001).

3. J. Tominaga, T. Nakano, and N. Atoda, Appl. Phys. Lett. 73, 2078 (1998).

4. T. Fukaya, J. Tominaga, T. Nakano, and N. Atoda, Appl. Phys. Lett. 75, 3114 (1999).

5. T. Nakano, A. Sato, H. Fuji, J. Tominaga, and N. Atoda, Appl. Phys. Lett. 75, 151 (1999).

6. J. Wei and F. Gan, Opt. Commun. 219, 261 (2003).

7. J. Wei and F. Gan, Appl. Phys. Lett. 82, 2607 (2003).

8. K. Yasuda, M. Ono, K. Aratani, A. Fukumoto, and M. Kaneko. Jpn. J. Appl. Phys. 32, 5210 (1993).

9. Y. Kasami, K. Yasuda, M. Ono, A. Fukumoto, and M. Kaneko. Jpn. J. Appl. Phys. 35, 423 (1996).

10. Y. Wu, H. Khoo, and T. Kogure, Appl. Phys. Lett. 64, 3225 (1994).

11. T. Kikukawa, T. Kato, H. Shingai, and H. Utsunomiya, Jpn. J. Appl. Phys. 40, 1624 (2001).

12. J. Wei, H. Ruan, H. Shi, and F. Gan, Chin. Sci. Bull. 47, 1604 (2002).

13. H. Ruan and J. Wei, Proc. SPIE 4930, 124 (2002).

14. J. Wei and F. Gan, Opt. Eng. 41, 2073 (2002).

15. J. Wei, H. Ruan, H. Shi, and F. Gan, Chin. Phys. 11, 1073 (2002).

16. J. Wei, H. Ruan, and F. Gan, Proc. SPIE 5060, 167 (2002).

17. J. Wei and F. Gan, Opt. Eng. 42, 1749 (2003).

18. B. Gijs and J. H. M. Sprait, Appl. Opt. 29, 3766 (1990).


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