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Chin. Opt. Lett.
 About  Editorial Board

Editorial Board
Editor-in-Chief
Zhizhan Xu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Executive Editors-in-Chief
Changhe Zhou, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
David Hagan, University of Central Florida, USA
Associate Editors-in-Chief
See Leang Chin, University Laval, Canada
Xianfeng Chen, Shanghai Jiao Tong University, China
Qihuang Gong, Peking University, China
Joseph W. Haus, University of Dayton, USA
Ruxin Li, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Ting-Chung Poon, Virginia Tech, USA
Xi-Cheng Zhang, University of Rochester, USA
Advisory Editors
Joseph H. Eberly, University of Rochester, USA
Fuxi Gan, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Yuen-Ron Shen, University of California, USA
Zhijiang Wang, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Bingkun Zhou, Tsinghua University, China
Editorial Board
George Barbastathis, Massachusetts Institute of Technology, USA
Yves Bellouard, Ecole Polytechnique Fédérale de Lausanne, Switzerland
Xuzong Chen, Peking University, China
Junhao Chu, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, China
Daniel Elson, Imperial College London, UK
Bruce Z. Gao, Clemson University, USA
Min Gu, RMIT University, Australia
Guangcan Guo, University of Science and Technology of China, China
Sailing He, Royal Institute of Technology, Sweden
Xun Hou, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, China
Weisheng Hu*, Shanghai Jiao Tong University, China
Guoxiang Huang, East China Normal University, China
Jürgen Jahns, Fern University in Hagen, Germany
Shibin Jiang, University of Arizona, USA
Wei Jin, The Hong Kong Polytechnic University, China
Jin U. Kang, Johns Hopkins University, USA
Takayoshi Kobayashi, The University of Electro-Communications, Japan
Guifang Li, University of Central Florida, USA
Jianlang Li*, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Jiao Lin*, University of Melbourne, Australia
Chao Lu, The Hong Kong Polytechnic University, China
Yanqing Lu, Nanjing University, China
Qingming Luo, Huazhong University of Science & Technology, China
Jean-Michel Nunzi*,Queen's University, Canada
Wolfgang Osten, Universität Stuttgart, Germany
Li Qian*, University of Toronto, Canada
Fabian Rotermund*, Korea Advanced Institute of Science and Technology, Korea
Mengyan Shen, University of Massachusetts, USA
Yunlong Sheng, University Laval, Canada
Ephraim Suhir, University of California, USA
Limin Tong, Zhejiang University, China
Cesare Umeton, University of Calabria, Italy
Haifeng Wang, University of Shanghai for Science & Technology, China
Huitian Wang*, Nankai University, China
Zhiyi Wei, Institute of Physics, Chinese Academy of Sciences, China
Shusen Xie, Fujian Normal University, China
Lei Xu, Fudan University, China
Xianfan Xu, Purdue University, USA
Xiaocong Yuan*,Shenzhen University,China
Jie Zhang, Shanghai Jiao Tong University, China
Shuang Zhang,University of Birmingham, UK
Weili Zhang*, Oklahoma State University, USA
Jianqiang Zhu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Xiaolei Zhu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
*also serve as Topical Editors
Topical Editors
Chau-Jern Cheng, National Taiwan Normal University, China
Haobo Cheng, Beijing Institute of Technology, China
Nan Chi, Fudan University, China
Shangqing Gong, East China University of Science and Technology, China
Bai-Ou Guan, Jinan University, China
Ronqing Hui, The University of Kansas, USA
Patrick L. LiKamWa, University of Central Florida, USA
Cheng Liu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Tzu-Ming Liu, University of Macau, China
Xueming Liu, Zhejiang University, China
Baolong Lyu, Wuhan Institute of Physics and Mathematics, Chinese Academy of Sciences, China
Gero A. Nootz, United States Naval Research Laboratory, USA
Shilong Pan, Nanjing University of Aeronautics and Astronautics, China
Mingying Peng, South China University of Technology, China
Peng Xi, Peking University, China
Jing Xu, Zhejiang University, China
Shanhui Xu, South China University of Technology, China
Sihua Yang, South China Normal University, China
Libo Yuan, Guilin University of Electronic Technology, China
Lin Zhang, Tianjin University, China
Qingdong Zheng, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, China
Pu Zhou,National University of Defense Technology, China
Manuscript Office
Shanghai Institute of Optics and Fine Mechanics,
Chinese Academy of Sciences,
390 Qinghe Rd., Jiading,
P. O. Box 800-211,
201800, Shanghai, China
E-mail: col@siom.ac.cn
Tel: 0086-21-69918428
Fax: 0086-21-69918705
Copy Editors
Yanfang Hu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
E-mail: huyanfang@siom.ac.cn
Yaqun Liu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
E-mail: yqliu@siom.ac.cn
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